Swiss CNC Miniature Precision
Swiss CNC lathes machine probe pin tip diameters as small as Ø0.1mm with tip geometry accuracy ±0.005mm .
Custom Test Probe Pins Precision Machining made to your drawing. Review contact geometry, mating diameters and plating allowance, material, finishing and inspection requirements before production.

Test probe pins are precision-machined electrical contact components used in automated test equipment (ATE), in-circuit test (ICT) fixtures, functional test systems, wafer probe cards, and burn-in sockets to establish temporary electrical contact with semiconductor devices, printed circuit boards, and electronic assemblies during manufacturing test and quality inspection.

Coordinate geometry, material, finishing and inspection around the part's intended function.
Swiss CNC lathes machine probe pin tip diameters as small as Ø0.1mm with tip geometry accuracy ±0.005mm .
Review contact geometry, mating diameters and plating allowance and functional requirements before defining the process.
Contact tip surface finish Ra 0.2μm ensures uniform gold, rhodium, palladium, and nickel plating distribution .
Specify the tip geometry, mating diameters and plating allowances so finished probe dimensions can be inspected against the component drawing.
Review geometry, batch quantity and process requirements to prepare the quotation.
Review contact geometry, mating diameters and plating allowance before choosing the machining and inspection route.
Explore representative configurations and share your drawing for a product-specific review.

Complete pogo pin assemblies — plunger, barrel, and spring — for PCB ICT, functional test, and burn-in socket applications.

Vertical and cantilever wafer probe card pins for semiconductor die bond pad contact at 28nm–5nm technology nodes.

Crown, spear, serrated, flat, concave, and chisel tip probe pins for PCB in-circuit test and functional test fixtures.

High-temperature probe pins for BGA, LGA, QFP, and SOP device burn-in socket contact at 125–150°C.

Coaxial probe pin assemblies (50Ω and 75Ω) for RF test applications to 40 GHz+, and GSG (ground-signal-ground) probe tip components for on-wafer RF device characterization in VNA measurement applications.

Proprietary probe pin designs for novel probe card architectures, custom burn-in socket designs, and specialty test fixture applications — including non-standard diameters, lengths, tip geometries, and plating configurations.
Custom test probe pins for semiconductor devices and electronic assemblies. Select pin geometry, materials and plating around the test point, fixture layout and inspection requirements.
Custom probe pin components for wafer probe cards, packaged-device test sockets and burn-in assemblies. Specify contact pitch, tip geometry, material and plating to match the test interface and assembly drawing.
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Test probe pins for ECU boards, ADAS sensor modules, power electronics and battery management systems. Define pad access, contact geometry and fixture alignment for continuity checks and functional testing during production.
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Custom contact pins and probe tips for smartphone, wearable and other consumer electronics test fixtures. Match tip profiles, test-point spacing and plating to PCB pads, connectors and repeated contact during production tests.
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Probe pin components for production testing of patient monitors, diagnostic instruments and medical electronics. Specify contact geometry, material traceability and handling requirements for circuit-board, connector and functional test fixtures.
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Probe pins and replaceable contact components for server motherboard, power supply and networking equipment test fixtures. Match contact spacing, connector access and pin geometry to board-level inspection and functional test requirements.
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Custom probe pin components for ground testing of avionics boards, instrument modules and electrical connectors. Specify contact tips, fixture alignment and inspection records around the test interface and supplied drawing.
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Confirm the exact grade, delivery condition and finish compatibility with your drawing.
Highest strength copper alloy · Excellent spring properties · Good conductivity · Pogo pin plungers, high-cycle ICT probes, burn-in socket pins
Higher conductivity BeCu · Good spring properties · High-conductivity pogo pin applications where current-carrying capacity is a priority
Excellent machinability · Good conductivity · Cost-effective · High-volume ICT probe pin barrels, low-cost pogo pin components
Good spring properties · Excellent corrosion resistance · Solderable · General ICT probe pins, moderate-cycle applications
Extreme hardness · High wear resistance · Wear-resistant wafer probe tips, high-cycle-count probe card cantilever pins
Maximum hardness · Minimum tip wear · Long-life wafer probe card cantilever pins at advanced semiconductor technology nodes
Excellent high-temperature spring properties · Oxidation resistant · Burn-in socket probe pins, high-temperature test applications to 150°C
Matched thermal expansion with ceramic packages · Hermetic package test socket components and precision ceramic-matched fixtures
Finish selection
Select the finish around the specified material, functional surfaces and service conditions. Confirm process details and acceptance requirements with your drawing.
The most widely used test probe pin plating for ICT, functional test, and burn-in socket applications.
Extremely hard (HV 800–1000), oxidation-resistant plating for ultra-high contact cycle applications exceeding one million cycles.
Higher hardness than pure palladium with excellent wear resistance and stable contact resistance.
Pure gold (99.9% Au, HV 60–80) plating for wafer probe card pin applications requiring maximum contact compliance and minimum contact resistance on delicate aluminum or copper bond pads.
Applied as a diffusion barrier underplate beneath gold, rhodium, and palladium on test probe pin contact surfaces to prevent base metal diffusion into the precious metal layer.
High electrical conductivity silver plating for high-current test probe pin applications including power device test and battery contact probe pins where maximum current-carrying capacity is the primary performance requirement.
Machining resources for drawing review, prototypes and repeat-production programs.
Inspection & documentation
Review material identity, machining datums, functional dimensions and production records for your component.
Final tolerances, inspection coverage and acceptance criteria are confirmed against your drawing, material and geometry.
Confirm the certificates, inspection reports and production records needed for your order when sharing your drawing.
The product range includes Pogo Pin Test Probes, Wafer Probe Card Pins, ICT & Functional Test Probe Pins. Custom geometry is reviewed against the approved drawing.
Material options include C17200 AT (Age-Tempered), C17500 (High Conductivity), C3604 Free-Machining Brass. The exact grade and condition should be confirmed for your application.
Define contact geometry, mating diameters and plating allowance, together with datums, tolerances and required surface condition.
Finishing options include hard gold plating, rhodium plating, palladium-cobalt plating. Applicability is reviewed against the specified material and geometry.
Pricing and delivery are confirmed after reviewing the drawing, material availability, quantity, machining route, finishing and inspection scope.
CUSTOM CNC PARTS
Share your drawing or 3D model, material, critical dimensions, finish and order quantity. We’ll review the machining route, inspection scope and delivery requirements.